斜测电离图描迹的自动提取

提出了一种能同时获取斜测电离图描迹和参数的方法，该方法采用准抛物模型描述电离层 F2层电子浓度分布。利用正割定理、Martyn 等效虚高定理、图像处理技术和电离图的回波特征确定部分电离层状态参数的最终值和部分参数的初始值及搜索空间。然后，利用最小群时延和残差分析提取 Es 层描迹。最后，使用混合遗传算法从搜索空间范围内找出一组最优参数，使合成的斜测电离图 F2层描迹与真实描迹吻合得最好。为了验证自动提取方法的有效性，对240张斜测电离图进行了自动提取，将得到的结果与斜测电离图的人工提取结果进行比较，结果显示该方法能够较准确地提取斜测电离图描迹和参数。

The intelligentized extraction of the traces from oblique ionogram

This paper describes an automatic scaling method for extracting the trace and parameters from oblique ionogram.The proposed technique adopts quasi-parabolic(QP)model to describe the elec-tronic concentration distribution of F2 layer.The secant theorem,Martyn’s equivalent path theorem,im-age processing technology and echo characteristics of ionogram are used to determine the final values of some parameters.Then,the hybrid genetic algorithm is used to find a set of optimal parameters within the scope of search spaces to make sure that the synthesized F2 layer trace accords with the real trace best.In order to verify the performance of this method,120 oblique ionograms are scaled and their results are com-pared with manual scaling results and vertical data.Comparison results show that the method can accurate-ly scale oblique ionogram parameters.