High-speed InP/InGaAs heterojunction bipolar transistors |
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Authors: | Chau H.-F. Beam E.A. III |
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Affiliation: | Texas Instrum. Inc., Dallas, TX; |
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Abstract: | Very-high-performance common-emitter InP/InGaAs single heterojunction bipolar transistors (HBTs) grown by metalorganic molecular beam epitaxy (MOMBE) are reported. They exhibit a maximum oscillation frequency (fT) of 180 GHz at a current density of 1×105 A/cm2. this corresponds to an (RBCBC)eff=f T/(8πf2max) delay time of 0.12 ps, which is the smallest value every reported for common-emitter InP/InGaAs HBTs. The devices have 11 μm2 total emitter area and exhibit current gain values up to 100 at zero base-collector bias voltage. The breakdown voltage of these devices is high with measured BVCEO and BVCEO of 8 and 17 V, respectively |
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