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A new S2-TEWMA control chart for monitoring process dispersion
Authors:Kashinath Chatterjee  Christos Koukouvinos  Angeliki Lappa
Affiliation:1. Department of Statistics, Visva-Bharati University, Santiniketan, India;2. Department of Mathematics, National Technical University of Athens, Zografou, Athens, Greece
Abstract:
Keywords:average run length  control chart  exponentially weighted moving average  process dispersion  standard deviation of run length  triple exponentially weighted moving average
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