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中子残余应力谱仪静态屏蔽体表面辐射剂量率初算
引用本文:李建,王虹,宋建明,刘丽鹃,孙光爱.中子残余应力谱仪静态屏蔽体表面辐射剂量率初算[J].核技术,2012(7):531-534.
作者姓名:李建  王虹  宋建明  刘丽鹃  孙光爱
作者单位:中国工程物理研究院核物理与化学研究所
基金项目:中国工程物理研究院科学技术发展基金项目(批准号:2010A0103002)资助
摘    要:中子残余应力谱仪静态屏蔽体主要用于对谱仪装置的附加闸门、中子导管等组件的辐射剂量的屏蔽,使装置操作人员可以安全地在装置周围活动。通过MCNP5程序对谱仪装置静态屏蔽体的屏蔽能力进行了计算,可为该方案的改进、优化提供依据,以便最终制造出满足辐射剂量要求的屏蔽体。

关 键 词:中子  残余应力谱仪  静态屏蔽体  MCNP5

Calculation of surface dose rate of shielding for residual stress neutron diffractometer
LI Jian,WANG Hong,SONG Jianming,LIU Lijuan,SUN Guangai.Calculation of surface dose rate of shielding for residual stress neutron diffractometer[J].Nuclear Techniques,2012(7):531-534.
Authors:LI Jian  WANG Hong  SONG Jianming  LIU Lijuan  SUN Guangai
Affiliation:(Institute Of Nuclear Physics and Chemistry,China Academy of Engineering Physics,Mianyang 621900,China)
Abstract:The static shielding of Residual Stress Neutron Diffractometer(RSND) is mainly used to protect the workers against-rays and neutrons from the reactor.The static shielding is mainly around the additional shutter and the neutron guide system.For providing ensured safety for personnel in the experiments area,calculations of the shielding system were carried out using the MCNP5 code.The shielding design can be optimized based on the calculation results.
Keywords:Neutron  Residual Stress Neutron Diffractometer  Static shielding  MCNP5
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