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Book Review : Introduction to Scanning Transmission Electron Microscopy. By Robert J. Keyse, Anthony J. Garrett-Reed, Peter J. Goodhew, and Gordon W. Lorimer, ßios Scientific Publishers, 1998; 114 Pages, 16.95 Pounds, Softcover, ISBN 1-85996-066-9.
Authors:Stanley M Dunn
Affiliation:(1) Rutgers University, Piscataway, New Jersey
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