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High resolution residual stress measurement on amorphous and crystalline plasma-sprayed single-splats |
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| Authors: | M Sebastiani G Bolelli L Lusvarghi PP Bandyopadhyay E Bemporad |
| Affiliation: | 1. University of Rome “Roma Tre”, Mechanical and Industrial Engineering Department, Via Vasca Navale 79, 00146 Rome, Italy;2. University of Modena and Reggio Emilia, Department of Materials and Environmental Engineering, Via Vignolese 905, 41125 Modena (MO), Italy;3. Department of Mechanical Engineering, Indian Institute of Technology Kharagpur, WB 721302, India |
| Abstract: | |
| Keywords: | Residual stresses Amorphous materials Splat quenching Plasma spraying Focused ion beam (FIB) |
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