| 不同偏置下10位双极模数转换器高低剂量率的辐射效应 |
| |
| 引用本文： | 胥佳灵,陆妩,吴雪,何承发,胡天乐,卢健,张乐情,于新. 不同偏置下10位双极模数转换器高低剂量率的辐射效应[J]. 核电子学与探测技术, 2012, 32(5): 578-582,622 |
| |
| 作者姓名： | 胥佳灵 陆妩 吴雪 何承发 胡天乐 卢健 张乐情 于新 |
| |
| 作者单位： | 1. 中科院新疆理化技术研究所,乌鲁木齐830011;新疆电子信息材料与器件重点实验室,乌鲁木齐830011
2. 中科院新疆理化技术研究所,乌鲁木齐830011;新疆大学物理科学与技术学院,乌鲁木齐830046;新疆电子信息材料与器件重点实验室,乌鲁木齐830011 |
| |
| 摘 要： | 研究了10位双极模数转换器(ADC)在60Coγ射线不同剂量率、不同偏置条件辐照下的电离辐射效应及退火特性。研究结果发现,此类模数混合信号电路在不同偏置和不同剂量率辐照下的电离辐照响应有较大差异。同一电参数既表现出低剂量率损伤增强效应(ELDRS)又表现出时间相关效应(TDE)。研究结果进一步表明,低剂量率辐照0 V偏置是最劣偏置;与之相反,高剂量率辐照5 V偏置是最劣偏置,而加电阻偏置对辐照损伤有一定的抑制作用。最后,结合空间电荷模型和边缘电场效应对其辐照损伤差异及退火机理进行了初步探讨。
|
| 关 键 词： | 双极模数转换器 60Coγ辐照 偏置条件 ELDRS 室温退火 |
Research on Irradiation Effects of 10 bit Bipolar ADC under Different Electron Energies |
| |
| XU Jia-ling , LU Wu , WU Xue , HE Cheng-fa , HU Tian-le , LU Jian , ZHANG Le-qing , YU Xin. Research on Irradiation Effects of 10 bit Bipolar ADC under Different Electron Energies[J]. Nuclear Electronics & Detection Technology, 2012, 32(5): 578-582,622 |
| |
| Authors: | XU Jia-ling LU Wu WU Xue HE Cheng-fa HU Tian-le LU Jian ZHANG Le-qing YU Xin |
| |
| Affiliation: | 1,3(1.Xinjiang Technical Institute of Physics & Chemistry,CAS,Urumqi 830011,China, 2.College of Physical Science and Technology,Xinjiang University,Urumqi 830046,China, 3.Xinjiang Key Laboratory of Electronic Information Material and Device,Urumqi 830011,China) |
| |
| Abstract: | Total-irradiation-dose effect and room-temperature annealing behavior of a 10-bit bipolar analog-to-digital converter(ADC) irradiated by 60Coγ-rays were investigated under different dose rates and bias conditions.The results show that the response of this kind of ADC circuit is very different under different conditions.The same electric parameters showed both enhanced low-dose-rate sensitivity effect(ELDRS) and time dependence effect(TDE).The further results show that 0V bias is the worst bias under low dose rate,while 5V bias is the worst under high dose rate.And the bias with the output terminal grounded via resistance has certain inhibition on the radiation damage.Finally,based on the space charge model and the fringing field effect,the differences of radiation damage and possible annealing mechanism was discussed. |
| |
| Keywords: | Bipolar ADC 60Coγ Radiation Bias conditions ELDRS Room-temperature annealing |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
|
