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Estimating errors in design sensitivities
Authors:Nair   D. Webb   J.P.
Affiliation:Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada;
Abstract:Design sensitivities are useful quantities that may be efficiently computed by finite element analysis, from the field solution and its adjoint. However, the computed sensitivities are subject to discretization error. A method is described for the a posteriori estimation of this error, making use of the properties of hierarchal finite elements. The method is applied to the sensitivities of microwave scattering parameters, computed with three-dimensional tetrahedral elements. Results for a waveguide filter, a waveguide transformer, and a magic T demonstrate the quality of the estimator.
Keywords:
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