金属化膜脉冲电容器可靠性研究

高储能密度金属化膜脉冲电容器是一种高可靠性、长寿命的器件，在短时间内很难得到它的失效数据，因此无法采用基于失效数据分析的传统可靠性分析方法来研究其可靠性。金属化膜脉冲电容器的失效是退化型失效，根据其失效机理，给出了电容器容值退化失效模型，依据该模型和电容器的容值退化数据，对该型电容器进行了可靠性研究，该型电容器的平均寿命为21165次充放电，其第10000次充放电时的可靠度为0．9454。在工程实践中使用该模型对该型电容器进行可靠性分析可以节约大量的试验成本。

Reliability Study of Metallized Film Pulse Capacitors

For the high reliability capacitors, it is difficult to assess the reliability by using the traditional time-to-failure analysis method. By analyzing degradation mechanism of the metallized film capacitors, a degradation failure model of metallized film pulse capacitors is presents. The reliability analysis basing this model is demonstrated and validated by the test data of metallized film capacitors. According to the reliability model, the probability of the capacitors that are survive to 10000 shot is 0.9454, the predicted lifetime of the capacitors is 21165(shot). This technique can not only assess and verify reliability level of the capacitors but also save tests cost.