Intrinsic microwave dielectric loss of lanthanum aluminate

The intrinsic dielectric properties of LaAlO? were investigated to understand the microwave properties of several materials containing LaAlO?. In this study, LaAlO? single crystals were prepared by the Czochralski method. The temperature dependence of the dielectric properties and neutron inelastic scattering of the single crystals were measured. From these data, the intrinsic dielectric properties were evaluated and it was found that the dielectric loss of the LaAlO? includes two types of dielectric loss. One is a phonon absorption-related loss and the other is a component of the loss arising from Debye- type orientation polarization. The latter affects the room temperature dielectric loss in materials containing LaAlO?. The present study suggests that avoiding this polarization loss is an important goal in decreasing the total dielectric loss.