Hybrid encoding for test data compression |
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| Affiliation: | 1. Department of Electronics and Communication Engineering, Dr. Mahalingam College of Engineering and Technology, Pollachi, India;2. Department of Electronics and Communication, CMS College of Engineering and Technology, Coimbatore, India;3. Department of Electronics and Instrumentation Engineering, Sri Ramakrishna Engineering College, Coimbatore, India;4. Department of Electronics and Communication, KLN College of Engineering, Pottapalyam, sivagangai District, India;5. Department of Electronics and Communication, Kumaraguru College of Technology, Coimbatore, India;1. Department of Electrical Engineering and Computer Science, University of Siegen, Germany;2. Department of Computer Science, Chungbuk National University, South Korea;1. Faculty of CSE, Department of Computer Science and Engineering, Sathyabama Institute of Science and Technology, Chennai, India;2. Department of IT, RMD Engineering College, Chennai, India;1. Technische Universität Wien (TU Wien), Vienna, Austria;2. Department of Electrical and Computer Engineering, Tennessee Tech University, Cookeville, TN, USA;3. National University of Sciences and Technology (NUST), Islamabad, Pakistan;1. Department of Electronics and Communication Engineering, KLN College of Information and Technology, Pottapalyam, Sivagangai District, India;2. Computer Science and Engineering, KLN College of Information and Technology, Pottapalyam, Sivagangai District, India;3. Department of Electronics and Communication Engineering, KLN College of Engineering, Pottapalyam, Sivagangai District, India |
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| Abstract: | Main disputes of digital integrated circuits testing are increasing test data volume and test power. The proposed encoding schemes are a combination of nine coded and selective pattern compression, Alternate Variable Run length code to reduce test data volume. The test cubes are divided into multiples of 8, 16, 32, and 64 blocks to upsurge the relationship among the successive test patterns which offers enriched test data reduction. The test data blocks are encoded with two methods in order to reduce test data volume. In the first method, the test sets are encoded using nine coded with selective pattern coding to expand the test data density. In the second method, the test sets are encoded using nine coded with Alternate variable run length laterally with selective pattern coding to improve the test data compression. Investigational results show that the proposed first and second approaches offer a maximum of 76% and 83% of compression ratio respectively for ISCAS’89 benchmark circuits. |
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