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Review of the influence of noise in X-ray computed tomography measurement uncertainty
Affiliation:1. Mechanical Engineering Department, KU Leuven, Belgium;2. Institute of Data Processing and Electronics, Karlsruhe Institute of Technology, Germany;1. Manufacturing Metrology Team, University of Nottingham, Nottingham, NG7 2RD, UK;2. Department of Engineering, University of Perugia, 06125, Italy;3. Centre for Additive Manufacturing, University of Nottingham, Nottingham, NG7 2RD, UK;1. Department of Mechanical Engineering, Technical University of Denmark (DTU), Produktionstorvet 425, 2800 Kgs. Lyngby, Denmark;2. Device R&D, Novo Nordisk A/S, Brennum Park, 3400 Hillerød, Denmark;1. Fraunhofer Application Center for Computed Tomography in Metrology (CTMT), Edlmairstr. 9, 94469 Deggendorf, Germany;2. Department of Mechanical Engineering and Mechatronics, Deggendorf Institute of Technology (DIT), Edlmairstr. 6+8, 94469 Deggendorf, Germany
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