X-ray photoelectron spectroscopic study of π electron delocalization in polyphenyls — a comparison with acenes and polystyrene |
| |
| Authors: | J. Riga J.J. Pireaux J.P. Boutique R. Caudano J.J. Verbist Y. Gobillon |
| |
| Affiliation: | Facultés Universitaires Notre-Dame de la Paix, Laboratoire de Spectroscopie Electronique, Rue de Bruxelles, 61, B-5000 Namur Belgium;Solvay et Cie, Laboratoire Central de Recherches, Rue de Ransbeek, 310, B-1120 Brussels Belgium |
| |
| Abstract: | High resolution core and valence X-ray photoelectron spectra of biphenyl, p-terphenyl, p-quaterphenyl and p-polyphenyl clarify the electronic structure of these aromatic compounds. Comparison with similar data for the lowest acenes (benzene, naphthalene, anthracene and tetracene) and polystyrene permits an evaluation of electron delocalization in relation to the electrical properties. Energy gaps of 5.8 eV for polystyrene and 4.0 eV for p-polyphenyl are obtained. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
