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Diamond-like carbon overcoat for TFMH using filtered cathodic arc system with Ar-assisted arc discharge
Affiliation:1. Department of Textile Engineering, Chemistry and Science, North Carolina State University, Campus Box 8301, Raleigh, NC 27695, USA;2. Department of Materials Science and Engineering, North Carolina State University, Campus Box 7907, Raleigh, NC 27695, USA;1. Biomedical Engineering Department, University of Michigan, Ann Arbor, MI 48109, USA;2. Mechanical Engineering Department, University of California, Riverside, CA 93210, USA;1. Institute of Chemistry, University of Bialystok, Hurtowa 1, 15-399 Bialystok, Poland;2. Department of Chemistry, University of Texas at El Paso, 500 W. University Ave., El Paso, TX 79968, USA
Abstract:The deposition system described for sub-30 Å and thicker carbon (ta-C) overcoat that includes two RF ion beam guns and Filtered Cathodic Arc (FCA) module mounted on a single vacuum chamber. The system is capable of flattening the Thin Film Magnetic Heads (TFMH) surface by ion beam etching; smoothing scratches, trenches, steps on boundaries of different materials, and enhancing the adhesion by ion assisted ion beam sputtering. It provides the highly controllable deposition of carbon using an FCA module with Ar-assisted arc discharge. Low-level particulates are achieved on the deposited film surface (< 5/cm2 ). It was shown that crucial impact on filtering the particles with size < 1 μm has the electrostatic field distribution across the plasma guide that can be controlled by duct bias. Mechanical and electrical properties, optical and Raman spectra of ta-C films were investigated as a function of Ar flow in the arc discharge area. At Ar flow rates 0–12 sccm, stress of the films was varied in a range 2.9–7.5 GPa while hardness and Young's Modulus stayed in ranges of 45–60 GPa, and 230–300 GPa, respectively. Density of the obtained films was greater than 2.8 g/cm3. Optical absorption and electrical conductivity of ta-C films showed a significant rise while stress came down with Ar flow. Raman G-peak was higher for ta-C films with lower stress and shifted to lower energy. The low stress films versus high stress films showed a few orders reduced electrical resistance and anisotropy of specific resistance with respect to substrate plane: ρ ? ρ. In situ ellipsometric control of growing film thickness was implemented on the system. Run-to-run standard deviation was less than 1 Å for 20–25 Å thick films. High corrosion resistance of FCA coatings was exhibited. The impact of Ar gas–carbon plasma interaction on the deposition conditions and microstructure of ta-C films was discussed.
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