Estimation of parameters in thermal-field emission from diamond |
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| Affiliation: | 1. Laboratoire d’Automatique, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland;2. Institute for Automation and Applied Informatics, Karlsruhe Institute of Technology, 76344 Eggenstein-Leopoldshafen, Germany;1. School of Defense Science, Chung Cheng Institute of Technology, National Defense University, Dasi, Taoyuan 335, Taiwan;2. Department of Photonics Engineering, Yuan Ze University, Chung-Li, Taoyuan 320, Taiwan;3. Department of Information Technology, Hsing Wu University, Linkou, New Taipei City 244, Taiwan;4. Department of Chemical and Materials Engineering, Chung Cheng Institute of Technology, National Defense University, Dasi, Taoyuan 335, Taiwan |
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| Abstract: | This paper reports on the behavior of electron field emission from diamond thin films at elevated temperatures. The study is motivated by the possibility of using these structures in high temperature electronics or direct energy conversion processes. Three diamond samples were tested: nanocrystalline diamond, crowned diamond tips, and peaked diamond tips. All samples displayed moderately efficient field emission characteristics. For each of the samples, the onset of field emission decreased as the sample temperature increased. Temperature effects, interpreted through advanced parameter estimation techniques, were shown to have a small influence on the estimated work function between 300 and 700 K, except for the peaked tip sample, whose estimated work function became very large at the highest temperature. Emission areas were also estimated and revealed similar trends to that of work function. |
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