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Radial mask for imaging systems that exhibit high resolution and extended depths of field
Authors:Ben-Eliezer Eyal  Marom Emanuel  Konforti Naim  Zalevsky Zeev
Affiliation:School of Electrical Engineering, Faculty of Engineering, Tel-Aviv University, Tel-Aviv 69978, Israel. eyalbe@eng.tau.ac.il
Abstract:A novel algorithm for the design of an imaging system that exhibits high resolution as well as extended depth of field is presented. This novel approach searches for an optimal pupil mask that minimizes the value of the mean-square error when performed over the intensity rather than in the field distribution of the acquired image. The captured images in such system do not require any postprocessing, and thus utilization of such a system is simplified. Simulations as well as experimental results are provided.
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