Thermomigration of tellurium precipitates in CdZnTe crystals grown by vertical bridgman method |
| |
| Authors: | T S Lee J W Park Y T Jeoung H K Kim C H Chun J M Kim I H Park J M Chang S U Kim M J Park |
| |
| Affiliation: | (1) Agency for Defense Development, Youseong, P.O. Box 35, Taejeon, Korea;(2) Korea University, Anamdong 5-1, Seongbugku, Seoul, Korea |
| |
| Abstract: | Te precipitates in CdZnTe have been characterized by x-ray diffraction at room and higher temperatures. From the x-ray results
at room temperature, it has been confirmed that Te precipitates in CdZnTe have the same structural phase as observed in elemental
Te under high pressure. The x-ray results at higher temperature indicate that Te precipitates melt around 440°C. CdZnTe samples
containing Te precipitates have been annealed at temperatures below and above 440°C with thermal gradient of ∼70°C/cm. Results
of the observation with infrared microscope before and after the annealings indicate distinct occurrence of thermomigration
of Te precipitates in samples annealed at temperature above 440°C compared with ones annealed at temperature below 440°C.
Thermomigration velocity obtained from these results is ∼50 μm/h. The average value for the effective diffusion coefficient
of the metallic atoms in Te precipitates calculated by using the thermomigration velocity is ∼3 x 10−5 cm2/s. |
| |
| Keywords: | CdZnTe effective diffusion coefficient Te precipitates thermomigration velocity x-ray diffraction |
| 本文献已被 SpringerLink 等数据库收录！ |
