| 接触器电寿命试验设备的设计 |
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| 引用本文： | 徐方荣. 接触器电寿命试验设备的设计[J]. 低压电器, 2009, 0(5): 17-19 |
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| 作者姓名： | 徐方荣 |
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| 作者单位： | 上海电器科学研究所(集团)有限公司,上海,200063 |
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| 摘 要： | 针对接触器电寿命试验的特点，利用晶闸管技术和单片机控制的方式设计了一种无触点试验设备，用于替代原有的采用接触器作为陪试品的试验方式。该设备具有成本低、控制精度高、响应时间短、可靠性高等特点，可满足低压电器检测行业的发展需求。
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| 关 键 词： | 接触器 晶闸管 寿命试验 检测 |
Design of Electrical Endurance Test Equipment for Contactor |
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| XU Fangrong. Design of Electrical Endurance Test Equipment for Contactor[J]. Low Voltage Apparatus, 2009, 0(5): 17-19 |
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| Authors: | XU Fangrong |
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| Affiliation: | XU Fangrong (Shanghai Electrical Apparatus Research Institute(Group) Co. , Ltd. , Shanghai 200063, China) |
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| Abstract: | Aiming at the characteristics of electrical endurance test of contactor, a non-contact test equipment was designed based on thyristor technique and single chip control, which can replace the conventional test with accompanying contactor.This equipment features with low cost, high precision, quick response and high reliability and can meet the requirements of low voltage electrical apparatus test industry. |
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| Keywords: | contactor thyristor lifetime test testing |
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