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Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections |
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| Authors: | A Jeffery R E Elmquist M E Cage |
| Affiliation: | National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 |
| Abstract: | Precision tests verify the dc equivalent circuit used by Ricketts and Kemeny to describe a quantum Hall effect device in terms of electrical circuit elements. The tests employ the use of cryogenic current comparators and the double-series and triple-series connection techniques of Delahaye. Verification of the dc equivalent circuit in double-series and triple-series connections is a necessary step in developing the ac quantum Hall effect as an intrinsic standard of resistance. |
| Keywords: | ac quantum Hall effect cryogenic current comparator dc quantum Hall effect equivalent electrical circuit quantized Hall resistance two-dimensional electron gas |