成败型元件可靠性的估计及置信下限

考虑成败型元件，其可靠性随储存时间的延长而有所改变．设在时刻ｔ＝０时元件可靠性为ｐ，在ｔ＝ｔｉ时元件可靠性为ａｉｐ，ａｉ已知，ｉ＝１，２，…，ｐ未知．假设在ｔ＝ｔｉ时进行Ｎｉ次试验，对每次试验是否成功需采用某种方式进行检测才能得知，而检测的正确率为，２，…，ｋ．在Ｎｉ次试验中被判为成功的次数为Ｓｉ．本文给出了ｐ的估计及置信下限．

The estimate and lower confidence limit of reliability for pass-fail component

Suppose A is a pass-fail component and the reliability of A depends on time t. Supposethat the reliability of A is aip, when t = ti for i=0, 1,2, ...,to=0, where ao = 1,ai,i =1, 2,3,... are known constants and p is an unknown parameter. Suppose that the number of testsis Ni when t=ti, the determination of the success or failure for every test depends on inspection, and the rate of the correct inspection is ri(is known). On the other hand,we assume that the number of successes according to the inspection in the Ni tests is Si (i= 0, 1, 2,...,k). In this paper, we obtain the estimate of p and the lower confidence limit of p according to the data (Ni,Si),i=0, 1,2...,k.