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Hot-carrier degradation in LDD-MOSFETs at high temperatures |
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| Authors: | Cemal T Dikmen Numan S Dogan and Mohamed Osman Arup Bhattacharyya |
| Affiliation: | School of Electrical Engineering and Computer Science Washington State University Pullman WA 99164-2752, U.S.A. IBM Microelectronics Essex Junction VT 05452, U.S.A. |
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