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基于频闪法的MEMS动静态测试系统
引用本文:王青玲,向东,何开华,吴娟,万淼.基于频闪法的MEMS动静态测试系统[J].光电工程,2007,34(2):27-31,36.
作者姓名:王青玲  向东  何开华  吴娟  万淼
作者单位:1. 中国地质大学,地球物理与空间信息学院,湖北,武汉,430074
2. 中国地质大学,数学与物理学院,湖北,武汉,430074;华中科技大学,光电工程系,湖北,武汉,430074
3. 中国地质大学,数学与物理学院,湖北,武汉,430074
基金项目:解放军总装备部预研项目
摘    要:为了对MEMS器件的3D形貌、垂向位移与形变、共振频率等特性进行精确的非接触式的测量,研制了一种基于激光频闪法的MEMS动静态测试系统.该系统以改进了的泰曼干涉仪为核心,采用激光照明,结合五步相移算法,获得MEMS器件静态表面的3D形貌图.使激光频闪的频率与MEMS器件驱动信号源频率一致可以获得相对"冻结"不变的3D形貌.改变频闪激光相对于MEMS器件驱动信号源的相对相位延时,可以获得周期内的MEMS器件离面运动轨迹等参数.本文设计并实现了与该系统配套的数据处理软件.该系统对于离面运动的测量精度可达1nm,最高测试频率可达500kHz.通过对可变形反射镜的测试验证了该系统的可靠性与通用性.

关 键 词:微机电系统  特性测试  频闪成像  相对延时
文章编号:1003-501X(2007)02-0027-05
收稿时间:2006/5/20
修稿时间:2006-05-202006-11-28

Measurement system for static and dynamic characterization of MEMS based on stroboscopic imaging
WANG Qing-ling,XIANG Dong,HE Kai-hua,WU Juan,WAN Miao.Measurement system for static and dynamic characterization of MEMS based on stroboscopic imaging[J].Opto-Electronic Engineering,2007,34(2):27-31,36.
Authors:WANG Qing-ling  XIANG Dong  HE Kai-hua  WU Juan  WAN Miao
Abstract:In order to measure surface shape, resonance frequency, out-of-plane motion and deformation of microstructures, a measurement system for static and dynamic characterization of MEMS was developed based on stroboscopic imaging and microscope interferometry. By means of improved Twyman-Green interferometer cooperated five-step phase-shift algorithm, the surface shape of the sample was acquired. By adjusting the relative time of the laser pulse train and drive waveform, dynamic characterization of MEMS sample in the periods was obtained. A new software matching the hardware was designed and implemented. The out-of-plane displacement resolution of the system can reach Into and the highest measurement frequency can reach 500kHz. The test of the static and dynamic characterization of deformable mirror verifies the practicability and reliability of the system.
Keywords:MEMS  Characteristic testing  Stroboscopic imaging  Relative time delay
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