A fast 3D modeling approach to electrical parameters extraction ofbonding wires for RF circuits |
| |
Authors: | Xiaoning Qi Yue P Arnborg T Soh HT Sakai H Zhiping Yu Dutton RW |
| |
Affiliation: | Center for Integrated Syst., Stanford Univ., CA ; |
| |
Abstract: | Bonding wires are extensively used in integrated circuit (IC) packaging and circuit design in RF applications. An approach to fast three-dimensional (3D) modeling of the geometry for bonding wires in RF circuits and packages is demonstrated. The geometry can readily be used to extract electrical parameters such as inductance and capacitance. An equivalent circuit is presented to model the frequency response of bonding wires. To verify simulation accuracy, test structures have been made and measured. Excellent agreement between simulated and measured data is achieved for frequencies up to 10 GHz. The model is well suited for the design and analysis of circuits for cellular phone communication (i.e., order 2 GHz) and future wireless communication (i.e., order 5 GHz) |
| |
Keywords: | |
|
|