Structural and photocarrier radiometric characterization of Cux(CdTe)yOz thin films growth by reactive sputtering

This research presents a structural and photocarrier radiometric (PCR) characterization of Cu_x(CdTe)_yO_z thin films grown using reactive radiofrequency co-sputtering. Electronic distribution induced by variations in dopant concentration as a function of the position was studied using photocarrier radiometric images. Optical and structural characterization of these thin films was carried out by using micro Raman spectroscopy and X-ray diffraction. Due to its nondestructive and noncontact characteristics, the PCR is an excellent technique that permits one to obtain details of lateral electronic distribution across the sample. It was found that Cu target power influences the electronic distribution and produces different phases such as Cu₂Te and CdO.