EPR studies of point defects in Cu-III–VI2 chalcopyrite semiconductors |
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| Authors: | K. Sato |
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| Affiliation: | Department of Applied Physics, Tokyo University of Agriculture and Technology, Koganei, Tokyo 184-8588, Japan |
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| Abstract: | EPR and PL spectra were measured to investigate point defects in I–III–VI2 type chalcopyrite semiconductors where the group I element is Cu. Taking into account various optical spectra, the EPR signals observed were assigned to defect centers involving residual Fe impurities and Cu-vacancies. Some of the point defects were found to form defect-complexes. |
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| Keywords: | Author Keywords: Chalcopyrite semiconductors Electron paramagnetic resonance Photoluminescence |
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