Evaluation of temperature effect on the corrosion process of 304 stainless steel in high temperature water with electrochemical noise |
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| Affiliation: | 1. State Key Laboratory of Hydraulic Engineering Simulation and Safety, Tianjin University, Tianjin 300072, PR China;2. Tianjin Key Laboratory of Composite and Functional Materials, School of Materials Science and Engineering, Tianjin University, Tianjin 300072, PR China;1. UMR PAM, Equipe PAPC, Université Bourgogne Franche-Comté, 1 esplanade Erasme, F-21078 Dijon, France;2. Institut Universitaire de la Vigne et du Vin, Université Bourgogne Franche-Comté, 1 rue Claude Ladrey, F-21078 Dijon, France;3. Laboratoire Interdisciplinaire Carnot de Bourgogne, UMR 6303 CNRS, Université Bourgogne Franche-Comté, 9 avenue Alain Savary, B.P. 47870, F-21078 Dijon, France;1. School of Materials, University of Manchester, Oxford Road, M13 9PL Manchester, United Kingdom;2. Rolls Royce plc, 65 Buckingham Gate, SW1E 6AT London, United Kingdom;1. Department of Mining Engineering and Metallurgical Engineering, Western Australian School of Mines Curtin University, GPO Box U1987, Waterford, WA 6152, Australia;2. Curtin Corrosion Engineering Industry Centre, School of Chemical and Petroleum Engineering, Curtin University, Bentley, WA 6102, Australia |
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| Abstract: | The effect of temperature on corrosion process of 304 stainless steel (SS) in high temperature water was investigated by electrochemical noise (EN), scanning electron microscope (SEM), Raman spectrum and X-ray photoelectron spectroscopy (XPS). The experimental results showed that the corrosion process could be divided into two stages (passivity and active dissolution) with the increasing temperature. At 100 °C, the oxide film was a single layer mainly consisting of Cr2O3. However, at 250 °C, it became a double layer with an inner layer of Cr–Fe spinel compound and an out precipitated layer. The related growth mechanisms of the oxide film were also discussed. |
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| Keywords: | Stainless steel High temperature corrosion EN Raman spectroscopy XPS |
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