斯密特棱镜偏振特性的Mueller矩阵法分析和检测

斯密特棱镜的偏振像差导致了成像质量的下降,对斯密特棱镜偏振像差的矫正效果的定量检测成为当务之急。Mueller矩阵法不仅可以用于斯密特棱镜偏振特性的分析,而且可以作为斯密特棱镜偏振特性的表征和检测对象。采用双旋转延长器的结构,通过两个四分之一波片的周期变化,对入射光的偏振态进行调制,用傅里叶级数法计算出斯密特棱镜Mueller矩阵元,经分析计算和实验检测,得到其对应两路径的位相延迟差和双向衰减率都明显不相同。用双向衰减率和位相延迟差表征斯密特棱镜的偏振像差,数据直接来自Mueller矩阵,直观、便捷是其最大的特点。

Schmidt prism polarization properties of the Mueller matrix method for analyzing and measuring

The polarization aberration of the Schmidt prism resulted in the decline in the quality of imaging, as a result, the quantitative detection of the Schmidt prism to correct the polarization aberration has become a top priority. Mueller matrix method can be used not only for the analysis of the polarization properties of the Schmidt prism, but also as the characterization and detected object of the Schmidt prism′s polarization properties. Dual rotating retarder configuration is applied, whose incident is modulated by synchronously rotating two quarter waveplates. And Schmidt prism′s matrix elements are calculated by Fourier series. According to the calculation and analysis and experiment of the Mueller matrix element, the obtained retardance and diattenuation in the two different ways are obviously different from each other. The diattenuation and retardance have been employed to characterize the polarization aberration of the Schmidt prism, and they are from the Mueller matrix directly. Obviously, Mueller matrix method is intuitive and convenient both in theory analysis and experiment.