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Effect of Radio-Frequency and Low-Frequency Bias Voltage on the Formation of Amorphous Carbon Films Deposited by Plasma Enhanced Chemical Vapor Deposition
Authors:Hadar MANIS-LEVY  ;Tsachi LIVNEH  ;Ido ZUKERMAN  ;Moshe H MINTZ
Affiliation:[1]Department of Nuclear Engineering, Ben-Gurion University of the Negev,Beer-Sheva 84105, Israel; [2]NRC-Negev, Beer-Sheva 84190, Israel; [3]Advanced Coatings Center, Rotem Industries Ltd., Mishor Yamin, D.N. Arava 86800, Israel
Abstract:amorphous carbon, PECVD, film deposition, FTIR, Raman
Keywords:amorphous carbon  PECVD  film deposition  FTIR  Raman
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