Nanoscale fretting wear study by scanning probe microscopy

Nanoscale fretting wear was studied by using scanning probe microscopy (SPM) and a newly proposed unified approach of slip index. The production of SiO₂ colloidal probes and the SPM calibration are described. Partial and gross slip fretting with displacement amplitudes from 5 to 500 nm were used for the study. Friction coefficient and nanowear results are presented showing a substantial increase of the friction at the transition from partial to gross slip and a significant difference between damaged surfaces in the two fretting regimes.