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Nanoscale fretting wear study by scanning probe microscopy
Authors:M.?Varenberg,I.?Etsion  author-information"  >  author-information__contact u-icon-before"  >  mailto:etsion@tx.technion.ac.il"   title="  etsion@tx.technion.ac.il"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,G.?Halperin
Affiliation:(1) Department of Mechanical Engineering, Technion, Haifa, 32000, Israel
Abstract:Nanoscale fretting wear was studied by using scanning probe microscopy (SPM) and a newly proposed unified approach of slip index. The production of SiO2 colloidal probes and the SPM calibration are described. Partial and gross slip fretting with displacement amplitudes from 5 to 500 nm were used for the study. Friction coefficient and nanowear results are presented showing a substantial increase of the friction at the transition from partial to gross slip and a significant difference between damaged surfaces in the two fretting regimes.
Keywords:nanoscale  fretting  scanning probe microscopy  colloidal probe  wear
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