The equivalent temperature coefficient of resistance of thin film resistor-conductor structures

Using the basic definition of the temperature coefficient of resistance (TCR), we developed a theoretical method for estimating the effect of the high TCR of conductors on the final TCR of resistor-conductor systems.

To investigate the relations developed, we studied several thin film resistors on various substrates. The experimental results for the combined TCR of the resistor-conductor systems correspond well with the theoretically predicted values.