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Discrimination of heavy and light elements in a specimen by use of scanning transmission electron microscopy
Authors:PJ Andree  JE Mellema  RWH Ruigrok
Affiliation:Department of Biochemistry, State University of Leiden, Wassenaarseweg 64, 2333 AL Leiden, The Netherlands
Abstract:Heavier elements have a larger scattering cross-section for elastically scattered electrons than lighter ones. Furthermore, the maximum number of scattered electrons is at higher scattering angles for heavier atoms. These differences can be used, in principle, to distinguish heavy and light elements from each other in dark field Scanning Transmission Electron Microscopy (STEM). We have achieved such discrimination in practice by collecting the electrons in a STEM experiment at two different angles. The information about the elemental composition that these two images together contain is visualized by forming linear combinations of the images which are specific for light and heavy elementsrrespectively. The results are demonstrated for a specimen consisting of platinum grains on a holey carbon film and for granulocytes stained with osmium tetroxide.
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