首页 | 本学科首页   官方微博 | 高级检索  
     

AFM动态电场诱导氧化加工的电流分析
引用本文:胡晓东,黄毛毛.AFM动态电场诱导氧化加工的电流分析[J].纳米技术与精密工程,2010,8(4).
作者姓名:胡晓东  黄毛毛
作者单位:天津大学精密测试技术及仪器国家重点实验室,天津,300072
基金项目:新世纪优秀人才支持计划资助项目,科技部国际科技合作与交流专项资助项目 
摘    要:对Si表面动态电场作用下利用原子力显微镜(atomic force microscope,AFM)诱导氧化加工进行了实验研究,通过监测加工过程中的电流变化进行了加工机理和工艺的分析.施加的动态电场为方波,频率范围为1 Hz~10MHz,获得的氧化物高度为1 nm~2 nm.实验结果表明氧化加工过程中,探针、氧化物和Si之间构成了导体-绝缘体-半导体隧道结,其电容效应会影响氧化物的继续生成.采用调制电压进行诱导氧化加工可以提高氧化物的生长速度和优化氧化物的纵横比.实验得出采用频率约为10~100 Hz的调制电压,可获得最优的纵横比.

关 键 词:原子力显微镜(AFM)  动态电场  诱导氧化  纳米加工  电流分析

Current Analysis of Dynamic Electric Field Induced Oxidation Nanofabrication with AFM
HU Xiao-dong,HUANG Mao-mao.Current Analysis of Dynamic Electric Field Induced Oxidation Nanofabrication with AFM[J].Nanotechnology and Precision Engineering,2010,8(4).
Authors:HU Xiao-dong  HUANG Mao-mao
Affiliation:HU Xiao-dong; HUANG Mao-mao (State Key Laboratory of Precision Measuring Technology and Instruments; Tianjin University; Tianjin 300072; China);
Abstract:Dynamic electric field induced oxidation nanofabrication with atomic force microscope(AFM) on Si surface was studied in experiments,and the fabrication mechanism and technique were analyzed by monitoring the current waveform in the fabrication process.Square wave voltages with frequency ranging from 1 Hz to 10 MHz were applied and the height of the obtained oxide was from 1 nm to 2 nm.Experimental results show that a conductor-insulator-semiconductor tunnel junction forms between the tip,oxide and the silic...
Keywords:atomic force microscope(AFM)  dynamic electric field  induced oxidation  nanofabrication  current analysis
本文献已被 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号