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Arc-based evaluation and detection of ellipses
Authors:Yu Qiao [Author Vitae]  SH Ong [Author Vitae]
Affiliation:a Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore
b Division of Bioengineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore
c Biomedical Imaging Lab, Agency for Science, Technology and Research, 30 Biopolis Street, #07-01 Matrix, Singapore 138671, Singapore
Abstract:We propose the use of elliptic arcs as a reliable criterion for ellipse evaluation and reconstruction. A technique based on pixel connectivity is developed for detecting the endpoints and subtended angles of elliptic arcs. Model-based distance and angular connectivity are introduced for quick and meaningful estimation of elliptic arcs. An iterative algorithm for multiple-ellipse fitting based on arc detection is presented. Experimental results confirm the robustness and accuracy of the algorithm for the fitting of multiple overlapping ellipses.
Keywords:Ellipse verification  Ellipse detection  Elliptic arc  Model-based distance  Connectivity  Angular connectivity
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