Improvements of the SiC homoepitaxy process in a horizontal cold-wall CVD reactor |
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Authors: | F Wischmeyer E Niemann H L Hartnagel |
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Affiliation: | (1) Daimler-Benz AG, Research and Technology, FT2/EM, Goldsteinstr. 235, D-60528 Frankfurt, Germany;(2) Technical University Darmstadt, Institut für Hochfrequenztechnik, Merckstr. 25, D-64283 Darmstadt, Germany |
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Abstract: | In this research effort, we investigate the influence of the cold-wall reactor geometry on the chemical vapor deposition (CVD)
growth process of 4H-SiC and the quality of lightly doped epitaxial layers. Stable growth conditions with respect to growth
rate and C/Si ratio of the gas-phase can be achieved by the appropriate choice of the distance between susceptor and walls
of the inner quartz tube. A background doping concentration in the range of 1014 cm−3 is realized by employing a high temperature stable and hydrogen etch resistant coating of the graphite susceptor. Doping
and thickness homogeneity of epitaxial layers on 35 mm diam. 4H-SiC substrates, expressed by σ/mean, are as low as 6.9 and
7.7%, respectively. From deep level transient spectroscopy measurements, the concentration of the frequently reported intrinsic
Z1-center in 4H-SiC is determined to be below the detection limit of 1012 cm−3. |
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Keywords: | Chemical vapor deposition (CVD) deep level transient spectroscopy (DLTS) doping homogeneity horizontal reactor purity SiC |
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