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Combining XRD and EXAFS with on-Line Catalytic Studies for in situ Characterization of Catalysts
Authors:Grunwaldt  Jan-Dierk  Clausen  Bjerne S
Affiliation:(1) Haldor Topsøe A/S, Nymøllevej 55, DK-2800 Lyngby, Denmark
Abstract:Advances in the study of catalysts by in situ structural characterization, using X-ray absorption spectroscopy (XAFS) and X-ray diffraction (XRD), have recently been achieved and they are illustrated by reference to several examples. Emphasis in the present overview is laid on the study of catalysts under realistic working conditions and therefore in particular on-line gas analysis during activation and/or during catalysis. The examples encompass (a) activation of copper-based methanol catalysts, (b) dynamic changes of copper-based catalysts during methanol synthesis conditions, (c) catalytic partial oxidation on Rh/Al2O3 catalysts, and (d) reduction (activation) of copper-promoted high temperature shift catalysts.
Keywords:EXAFS  XRD  in situ  time-resolution  copper  methanol synthesis  rhodium  catalytic partial oxidation  high temperature shift catalyst  promoter  fluorescence XAFS  piezo XAFS
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