雪崩光电二极管过剩噪声的测量和抑制方法

雪崩光电二极管(APD)因为其高灵敏度和高增益带宽的优势已被广泛应用在高比特率、远程光纤通信系统中,而雪崩过程中产生的过剩噪声直接影响到APD的信噪比,因此,研究过剩噪声对APD性能的提升具有重要意义.目前,国内外测试雪崩光电二极管过剩噪声的方法主要有直接功率测量法和相敏探测法,本文对这两种测试方法和其优缺点进行了分析...

Measurement and Suppression Method for Excess Noise in Avalanche Photodiodes

Avalanche photodiodes (APDs) have been widely used in high bit rate, long-distance optical fiber communication systems because of their high sensitivity and gain bandwidth. The excess noise generated in the avalanche process has a significant impact on the sensitivity of APD. Therefore, the study of excess noise is crucial for the improvement of APD performance. The existing methods for testing excess noise of avalanche photodiodes primarily include direct power measurement and phase-sensitive detection. This article briefly introduces these testing methods, analyzes their advantages and disadvantages, and summarizes the state-of-the-art testing methods. Additionally, three methods to reduce excess noise are summarized: choosing materials with low impact ionization coefficient, using relaxation space to change the thickness of the multiplier layer to reduce the number of impact ionization of carriers and engineering the APD for appropriately heterogeneous impact ionization.