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Nitrogenated carbon films deposited using filtered cathodic arc
Affiliation:1. Department of Materials Science and Engineering, National Tsing Hua University, 101, Sec. 2, Kuang-Fu Rd., Hsinchu 30013, Taiwan;2. Department of Materials Engineering, Ming Chi University of Technology, 84 Gungjuan Rd., Taishan Dist., New Taipei City 24301, Taiwan;1. Neuroepidemiology Unit, Department of Neurology, Boston Children''s Hospital, Harvard University, Boston, MA 02115, United States;2. Laboratory of Genital Tract Biology, Department of Obstetrics, Gynecology, and Reproductive Biology, Brigham and Women''s Hospital, Boston, MA 02115, United States;3. Division of Neurology, Department of Pediatrics, Boston Medical Center and Boston University, Boston, MA 02118, United States;4. Department of Pediatrics, Wake Forest University, Winston-Salem, NC 27157, United States;5. Department of Public Health and Community Medicine, Tufts University School of Medicine, Boston, MA 02111, United States;6. Perinatal Neuropidemiology Unit, Hannover Medical School, 30625 Hannover, Germany
Abstract:Nitrogenated carbon films were deposited on various substrates using filtered cathodic arc. Non-uniformity of the film thickness was less than 5% over a 15 cm diameter area. Mechanical, optical (refraction index, extinction coefficient versus wavelength) and electrical properties were investigated as a function of nitrogen flow rate. Deposited coatings demonstrated high hardness of 40–65 GPa, Young's modulus 200–285 GPa, excellent elastic recovery, high critical pressure for scratch formation, and surface smoothness. While the hardness showed a relatively small decrease with nitrogen flow increase, the stress decrease was more significant (8–3.8 GPa). Extremely low wear rates were observed, even at high contact pressures, and no substantial debris was detected indicating that carbon is oxidized during wear. Clear correlation was found between transparency, electrical resistivity and stress of the films. Transparency and resistivity showed a significant rise with an increase of stress. An explanation of the film properties is based on the assumption that the basic characteristics of the deposited films were determined by the relative proportion of two three dimensional complementary type of bonds; the tetrahedral sp3 bonds leading to stiff networks, and the trigonal sp2 arrangments close to fullerene-like, or nanotube-like, structures.
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