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Rapid isothermal processing for fabrication of GaAs-basedelectronic devices [HBTs]
Authors:Pearton   S.J. Ren   F. Katz   A. Fullowan   T.R. Abernathy   C.R. Hobson   W.S. Kopf   R.F.
Affiliation:AT&T Bell Lab., Murray Hill, NJ;
Abstract:The use of rapid isothermal processing (RIP) is detailed for each of the three annealing steps in the fabrication of heterostructure-based devices such as heterojunction bipolar transistors (HBTs). RIP can be used for the alloying of ohmic metal contacts, annealing of ion-bombarded regions for device isolation or parasitic capacitance reduction, and for conventional implant activation annealing. High-speed (fT=65 GHz) HBTs were achieved using RIP for all of the required heating steps. The authors compare the use of several types of silicon carbide-coated graphite susceptors for eliminating slip formation on 2- and 3-in-diameter GaAs wafers during high-temperature implant activation annealing
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