首页 | 本学科首页   官方微博 | 高级检索  
     


Control of growth and structure of Ag films by the driving frequency of magnetron sputtering
Authors:Peifang YANG  Chao YE  Xiangying WANG  Jiamin GUO  Su ZHANG
Affiliation:1. College of Physics, Optoelectronics and Energy, Soochow University, Suzhou 215006, People's Republic of China;2. College of Physics, Optoelectronics and Energy, Soochow University, Suzhou 215006, People's Republic of China;Key Laboratory of Thin Films of Jiangsu Province, Soochow University, Suzhou 215006, People's Republic of China;3. Medical College, Soochow University, Suzhou 215123, People's Republic of China
Abstract:The growth and structural properties of Ag films prepared by radio-frequency (2,13.56 and 27.12 MHz) and very-high-frequency (40.68 and 60 MHz) magnetron sputtering were investigated.Using 2 MHz sputtering,the Ag film has a high deposition rate,a uniform and smooth surface and a good fcc structure.Using 13.56 and 27.12 MHz sputtering,the Ag films still have a high deposition rate and a good fcc structure,but a non-uniform and coarse surface.Using 40.68 MHz sputtering,the Ag film has a moderate deposition rate and a good fcc structure,but a less smooth surface.Using 60 MHz sputtering,the Ag film has a uniform and smooth surface,but a low deposition rate and a poor fcc structure.The growth and structural properties of Ag films are related to the ions' energy and flux density.Therefore,changing the driving frequency is a good way to control the growth and structure of the Ag films.
Keywords:Ag films  RF and VHF magnetron sputtering  structural property
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《等离子体科学和技术》浏览原始摘要信息
点击此处可从《等离子体科学和技术》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号