SOC中的MBIST设计

随着超大规模集成电路的发展,设计的集成度越来越高,基于IP的SOC设计正在成为IC设计的主流.为了确保SOC的功能正确,可测性设计(Design for Test,简称DFT)显得尤为关键.DFT设计包括扫描设计、JTAG设计和BIST设计.另外,当前SOC芯片中集成了大量的存储器,为了确保存储器没有故障,基于存储器的...

The MBIST Architecture for SOC

With the development of CMOS IC,the integration of design is becoming larger and larger.So System-on-Chip（SOC） which is based on IP is the main direction of IC design.In order to insure SOC function,Design-for-Test（DFT） is more and more popular.DFT include SCAN 、JTAG and BIST.At the same time,SOC contain a lot of memories.To test these memories,memory Build-in-Self-Test（MBIST） is very useful.The paper explains how to design JTAG and MBIST and how to use ARM TAP to control MBIST.This method can achieve DFT and save hardware spending.