Sensor properties and surface characterization of the metal-deposited SPR optical fiber sensors with Au,Ag, Cu,and Al |
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| Affiliation: | 1. Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima University, 1-21-40 Korimoto, Kagoshima 890-0065, Japan;2. Tokyo Ohka Kogyo Co., Ltd., 150 Nakamaruko, Nakahara-ku, Kawasaki, Kanagawa 211-0012, Japan;1. School of Physics and Electronics, Shandong Normal University, Jinan 250014, China;2. Institute of Materials and Clean Energy, Shandong Normal University, Jinan 250014, China;3. College of Physics and Electronic Information, Institute of Biophysics, Dezhou University, Dezhou 253023, China;1. School of Pure & Applied Physics, Mahatma Gandhi University, Kottayam 686 560, India;2. Division of Materials Science, Department of Engineering Sciences and Mathematics, Luleå University of Technology, SE-971 87, Luleå, Sweden;3. Department of Optoelectronics, University of Kerala, Thiruvananthapuram 695 581, Kerala, India |
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| Abstract: | Metal-deposited optical fiber sensors with Cu and Al with a film thickness of 45 nm based on surface plasmon resonance (SPR) were fabricated for the first time. The response curves and the properties of these sensors were investigated with a comparison of those of the sensors with Au and Ag. The reflection properties of thin films of Au, Ag, Cu, and Al due to the SPR phenomenon were also measured and considered. The metal-deposited SPR optical fiber sensors with Au, Ag, and Cu have high sensitivities and good responses. Though the sensor with Al shows a lower sensitivity, it has a wider response range in the refractivity. The response curve of the sensor with Au calculated from SPR theoretical equations agreed well with that obtained by the experiment. However, the response curves of the sensors with Ag, Cu, and Al have the effects of the surface oxide layers. The surface characterization of these metal films by X-ray photoelectron spectroscopy (XPS) showed the presence of oxide layers on the films of Ag, Cu, and Al. A very thin (about 0.3 nm) oxide layer is present on Ag, while thick (about 2 nm) oxide layers are present on Cu and Al. |
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