Probing interfacial properties of ferromagnetic/insulator bilayers with X-ray spectroscopies: Application to Fe,Co, Mn/MgO(0 0 1) interfaces |
| |
| Affiliation: | 1. School of Mechanical and Manufacturing Engineering, The University of New South Wales, NSW 2052, Australia;2. Department of Mechanical engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong |
| |
| Abstract: | Electronic and magnetic properties of bcc Co, Fe and Mn(0 0 1) epitaxial monolayers in contact with a single-crystalline MgO(0 0 1) film were studied using X-ray photoemission spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD) measurements. The XPS and XAS analysis clearly evidenced the weak hybridization between the MgO barrier and Fe or Co. On the contrary, a net oxidization of the Mn layer in contact with the MgO layer was observed. The magnetic properties were characterized by probing the XMCD signal of a unique atomic plane of transition metal in contact with MgO. The total magnetic moment per Co and Fe atoms were observed to increase compared to the bulk at the metal/oxide interface. Finally, Mn at the interface with MgO does not present any ferromagnetic behavior. This was assumed to be a consequence of the Mn oxidization. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
