Apparent contrast reversal in tapping mode atomic force microscope images on films of polystyrene-b-polyisoprene-b-polystyrene |
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Authors: | J P Pickering G J Vancso |
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Affiliation: | (1) Faculty of Chemical Technology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands, NL |
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Abstract: | Summary
Thin films of phase separated polystyrene-b-polyisoprene-b-polystyrene block copolymers were studied by tapping mode atomic force microscopy. The relative contrast in height and phase
mode images of the phase separated regions was found to be very sensitive to changes in the operating conditions of the microscope.
Contrast variations and reversals were observed for height and phase mode images as a function of the set-point amplitude
ratio and drive frequency. No unique height or phase contrast was observed for the the tri-block copolymer system examined
in this study.
Received: 30 December 1997/Revised version: 14 January 1998/Accepted: 15 January 1998 |
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