| 用于高速GaAs IC在片检测的电光取样系统 |
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| 引用本文： | 贾刚,衣茂斌.用于高速GaAs IC在片检测的电光取样系统[J].电子学报,1994,22(11):75-77. |
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| 作者姓名： | 贾刚 衣茂斌 |
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| 作者单位： | 集成光电子学国家重点联合实验室吉林大学实验区，吉林大学电子工程系 |
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| 摘 要： | 目前直接电光取样技术是在片检测砷化镓高速集成电路内部动态特性的最好方法。我们建立了半导体激光器电光取样系统，测试了梳状信号发生器输出的４３．７ｐｓ的电脉冲信号以及频率５ＧＨｚ的微波信号，并测试了频率３ＧＨｚ的微波信号的位相移动或时间延迟以及铁氧体微波移相器的静态特性曲线，这个系统将被应用于砷化镓高速集成电路内部动态特性在片检测。
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| 关 键 词： | 电光取样 高速集成电路 检测 半导体激光器 |
Electro-Optic Sampling System for On-Wafer Tests of High Speed GaAs IC |
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| Jia Gang,Yi Maobin,Sun Wei,Liu Zongshun,Cao Jie,Gao Dingsan.Electro-Optic Sampling System for On-Wafer Tests of High Speed GaAs IC[J].Acta Electronica Sinica,1994,22(11):75-77. |
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| Authors: | Jia Gang Yi Maobin Sun Wei Liu Zongshun Cao Jie Gao Dingsan |
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| Abstract: | Direct electro-optic sampling is a very powerful technique for characterizing high speed GaAs integrated circuits on wafer,An electro-optic sampling system using semiconductor lasers has been set up. It has been used to test 43.7 ps fuli width at half maximum electric pulses generated by a comb generator,SGHz microwave signaIs, phase shift or time delay of 3GHz microwave signals and static curve of microwave ferrite phase shifter. This system will be applied to the on-wafer tests of dynamic characters of high speed GaAs integrated circuits. |
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| Keywords: | Electro-optic sampling High speed integrated circuit On-wafer test Semiconductor laser Microwave |
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