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多工作温度非制冷热成像系统的研制
引用本文:张俊举,孙恋君,常本康,钱芸生,邱亚峰,田思. 多工作温度非制冷热成像系统的研制[J]. 兵工学报, 2008, 29(8): 920-924
作者姓名:张俊举  孙恋君  常本康  钱芸生  邱亚峰  田思
作者单位:南京理工大学电子工程与光电技术学院,江苏南京210094
摘    要:研究了非制冷热成像系统功耗产生的主要原因,提出了一种具有低功耗特点的多工作温度热成像系统。从非晶硅焦平面阵列探测器噪声等效温差和探测率的计算公式入手,分析了非晶硅焦平面阵列探测器响应特性与工作温度的关系。数值分析显示,在- 40℃~60℃工作温度范围内,非晶硅焦平面阵列探测器具有一致性的响应性能,这为设计多工作温度热成像系统奠定了理论基础。对所设计的多工作温度热成像系统测试结果:在- 40℃~60℃环境温度范围内,热电稳定器的功耗小于350 mW,噪声等效温差小于120 mK.这表明该热成像系统既具有稳定的成像质量,又具有较小的系统动耗。

关 键 词:信息处理技术    热成像系统    温度特性    噪声等效温差    探测率  

Design of Uncooled Thermal Imaging System Operating at Multiple Temperatures
ZHANG Jun-ju,SUN Lian-jun,CHANG Ben-kang,QIAN Yun-sheng,QIU Ya-feng,TIAN Si. Design of Uncooled Thermal Imaging System Operating at Multiple Temperatures[J]. Acta Armamentarii, 2008, 29(8): 920-924
Authors:ZHANG Jun-ju  SUN Lian-jun  CHANG Ben-kang  QIAN Yun-sheng  QIU Ya-feng  TIAN Si
Affiliation:School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology,Nanjing 210094,Jiangsu, China
Abstract:The reasons why thermal imaging system consumes power were analyzed, and a design scheme of lower Dower consumption thermal imaging system operating at multiple temperatures was presented. The relation between the response characteristics and operating temperature of a-Si focal plane array detector was studied by means of formulae oF its noise equivalent temperature difference(NETD) and detectivity. The numerical analysis shows that the detectivity decreases and JNETD in?creases slightly when the operating temperature rises. This indicates the detector has a uniform re?sponse in a wide operating temperature range. A thermal imaging system operating at multiple temper?atures was designed according to the analysis. The test results of system show the power consumptign of thermoelectric controller is less than 350 mW and NETD is less than 120 mK in the range of -40℃?60℃ . It shows that the system not only outputs high-quality images but has a lower power consumption.
Keywords:information processing technique    thermal imaging system    temperature characteristic    noise equivalent temperature difference    detectivity  
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