| IC优化设计的参数抽样效益折衷算法 |
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| 引用本文： | 万会兵,杨林耀.IC优化设计的参数抽样效益折衷算法[J].电子学报,1993,21(8):61-66. |
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| 作者姓名： | 万会兵 杨林耀 |
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| 作者单位： | 西安电子科技大学 西安710071
(万会兵，杨林耀，贾新章)，西安电子科技大学 西安710071(吴大正) |
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| 摘 要： | 本文对效益函数进行了扩展,提出了IC最优化设计的参数抽样效益折衷方法,较好地解决了IC统计多目标优化非劣解的协调问题,得到了一种改进的Monte Carlo成品率最优化设计方法.
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| 关 键 词： | 目标优化 抽样 集成电路 优化设计 |
An Optimization Technique Using Parametric Sampling and Income Tradeoff in IC' s Statistical Design |
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| Wan Hulbing,Yang Linyao,Jia Xinzhang,Wu Dazheng.An Optimization Technique Using Parametric Sampling and Income Tradeoff in IC'''' s Statistical Design[J].Acta Electronica Sinica,1993,21(8):61-66. |
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| Authors: | Wan Hulbing Yang Linyao Jia Xinzhang Wu Dazheng |
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| Abstract: | An extended income function and an optimization technique using tradeoff of the parametric sampling and income are suggested. The technique is capable of coordinating the feasible solutions of the statistical multiobjective optimization in the IC design. Based on this technique an improved Monte Carlo yield optimization algorithm is obtained. |
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| Keywords: | Multiobjective optimization Parameter sampling Benefit tradeoff Yeild optimization Statistical design |
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