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Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy |
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| Authors: | Martina Baeumler Frank Gütle Vladimir Polyakov Markus Cäsar Michael Dammann Helmer Konstanzer Wilfried Pletschen Wolfgang Bronner Rüdiger Quay Patrick Waltereit Michael Mikulla Oliver Ambacher Franck Bourgeois Reza Behtash Klaus J. Riepe Paul J. van der Wel Jos Klappe Thomas Rödle |
| Affiliation: | 1. Fraunhofer Institute for Applied Solid State Physics, Tullastr. 72, 79108, Freiburg, Germany 2. United Monolithic Semiconductors, Wilhelm-Runge-Strasse 11, 89081, Ulm, Germany 3. NXP Semiconductors, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands |
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