An overview of standards in electromagnetic compatibility for integrated circuits

The characterization of the electromagnetic compatibility (EMC) performance of integrated circuits (ICs) is receiving increasing focus as new applications and technology trends combine to raise the complexity of EMC compliance. The increased focus is driving the need for standardized measurement procedures to enable consistent evaluation and comparison of different devices. This paper discusses the need for standardization, describes the work in process by IEC TC47/SC47A Working Group 9 to standardize emissions and immunity EMC test methods for ICs, and examines trends in IC EMC.