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缺陷对红外测温反推内壁温度的影响分析
引用本文:沈立华, 范春利, 杨立, 孙丰瑞. 缺陷对红外测温反推内壁温度的影响分析[J]. 红外技术, 2005, 27(3): 250-253. DOI: 10.3969/j.issn.1001-8891.2005.03.016
作者姓名:沈立华  范春利  杨立  孙丰瑞
作者单位:海军工程大学船舶与动力工程学院307教研室,湖北,武汉,430033;海军工程大学船舶与动力工程学院307教研室,湖北,武汉,430033;海军工程大学船舶与动力工程学院307教研室,湖北,武汉,430033;海军工程大学船舶与动力工程学院307教研室,湖北,武汉,430033
摘    要:利用红外热像仪获得外壁温度,在简化的一维模型下反推内壁温度.分别分析了壁内存在缺陷,考虑缺陷内的空气对流换热及表面辐射对反推内壁温度的影响.反推的内壁温度大小与缺陷厚度成线性变化,而随着缺陷内介质导热系数的增加成非线性下降趋势,缺陷位于壁内时位置的影响可忽略.考虑缺陷内空气对流换热的影响下得出的温度与纯导热条件下得出的温度存在较大误差,辐射的影响可以忽略不计.结论对于实际工程中准确确定内壁温度有一定的指导作用.

关 键 词:红外测温  缺陷  对流换热  辐射
文章编号:1001-8891(2005)03-0250-04

Study on Effect of Defect to Computation of Inner Surface Temperature Based on Infrared Temperature Measurement
SHEN Li-hua, FAN Chun-li, YANG Li, SUN Feng-rui. Study on Effect of Defect to Computation of Inner Surface Temperature Based on Infrared Temperature Measurement[J]. Infrared Technology , 2005, 27(3): 250-253. DOI: 10.3969/j.issn.1001-8891.2005.03.016
Authors:SHEN Li-hua  FAN Chun-li  YANG Li  SUN Feng-rui
Abstract:A one-dimensional simplified model on the inner surface temperature computation converselybased on the outer surface temperature measured by infrared imager was presented. The inner surfacetemperature, when there are defects in the wall or air convective heat transfer and radiation are referred, isstudied respectively. The inner temperature is affected by the thickness of defect and conduction coefficientand the position of defect. In addition, the inner surface temperature with the effect of air convection in thedetect is different from the one in terms of considering air heat transfer in the defect as conduction and theeffect caused by radiation can be neglected. The conclusions are helpful for calculation of inner surfacetemperature in practice.
Keywords:infrared temperature measurement  defect  convective heat transfer  radiation
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